Basic Properties:
| Density (g/cm3) | 5.4 | Melting Point (°C) | 1875 |
| Refractive Index at Peak Emission | 1.95 | Emission Peak (nm) | 370 |
| Emission Spectral Range (nm) | 325-425 | Decay Time (ns) | 40 |
| Light Yield (photons/MeV) | 18000 | Radiation Length (cm) | 2.7 |
| Hygroscopic | None | Cleavage Plane | None |
Specifications:
| Growth Method | Czochralski | Formula | YAlO3(cerium content: 0.2~1.2 at%) |
| Maximum Dimension | ∅ 50 mm x 160 mm | Available Items | Single crystal |
| Metal Coating | Al, Au, Ag etc. | Protective Coating | SiO2 |
Cerium-doped yttrium aluminum (or Ce: YAP) crystals are a fast scintillating material, with a decay time of 40ns. The YAP(Ce) crystal is mechanically robust and chemically inert, making it suitable for high-precision processing during the fabrication procedure. An aluminum film could be deposited on the entrance surface to avoid light sensitivity. YAP(Ce) is well suited for imaging applications due to its ultra-low energy secondary X-ray emissions. Ce: YAP detectors are widely used in gamma and X-ray counting, electron microscopy, electron and X-ray imaging screens, and computer tomography (CT) systems.
Hangzhou Shalom EO offers the YAP(Ce) single crystals upon the customer's requirement; the maximum size available is ∅ 50 mm x 160 mm, and it is grown by the Czochralski method with a cerium concentration of 0.2~1.2at%. Besides the general cylindrical or rectangular-shaped YAP(Ce) crystals, Shalom EO also provides the YAP(Ce) thin screen for soft X-ray high-resolution imaging applications.
Application Notes: