Scintillation Detection Arrays (Coupled with Si PDs)

This product is a portfolio of linear Scintillation Detection Arrays; all the modules are coupled with 16-element, 64-element, or even 128-element Front-Side-illumination (FSI) monocrystalline Si photodiodes as the photo readout devices. The detector modules exhibit reliability and versatility for diverse applications that involve non-destructive X-ray inspection (e.g., baggage inspection, portal security, food inspection, etc.). Various scintillation materials, such as CsI(Tl), GOS ceramic screens, CdWO4, etc., could be incorporated. Compared to PMTs, photodiode readouts are advantageous in terms of low cost, excellent electrical current linearity, long life span, and high quantum efficiency (also known as responsivity).

Shalom EO’s scintillation detection arrays feature ultra-low dark current, high response speed, low terminal capacitance, and the photosensitivity spectrum extensively stretches from 350-1100nm, peaking approximately at 950nm. Additionally, this module is compact and lightweight, allowing easy integration, and it only requires a low maximum reverse voltage of <10V; the photosensitivity of the diode elements is impressively homogeneous.

Two standard scintillation materials are optional: the CsI(Tl) scintillation detector performs extremely high light output for high energy inspection, the GOS ceramic scintillation detector is for low energy inspections. The scintillation pixels of one array are separated by a reflector with a wide assortment of selective materials (e.g., MgO2, TiO2, ESR, BaSO4 White Plastic, White Epoxy, etc.) to avert optical crosstalk. A dual-energy X-ray imaging sensor could be obtained by combining one high-energy detector and one low-energy detector at the upper and lower stages. Furthermore, long-size line detectors are formed when aligning multiple detection arrays in a row.

About the specifications, the element size is 1.4mm in width x 2.5mm in height; the element pitch is 1.575mm, apt for compact security inspection systems. CsI(Tl) arrays are mounted on 25.4mm x 10.2mm boards, and GOS arrays are mounted on 25.4mm x 20mm boards. Other customized specifications could also be tailored upon request.

Versions that are integrated with data readout electronics are also available in Shalom EO.

Typical Applications:

• Non-destructive X-Ray Inspection
• Security Check
• Food Inspection
• Thickness measurement
• Industrial Process control
• Mineral Detection
• Waste Sorting

The manufacturing technique of GOS thin films:

Figure 1. The diagram showing the structure of Shalom EO's GOS scintillation thin films

1. Using the coprecipitation method to produce the mixed powder of Gd2O3 and Tb2O3;

2. High-temperature sulfurization sintering forms GdSO grains;

3. Add adhesives, press the material into pieces, bound the pieces together with the PET substrates;

4. Stick a protective layer onto the light-exiting surface;

5. Obtain Gd2OS2:Tb thin films, the emission peak is 550nm.

Shalom EO supplies the following standard modules of GOS ceramic thin films; other custom GOS scintillation thin films are also available. For more info about the GOS thin films, check our GOS ceramic thin film web page.

Properties of Scintillators:

Operating Conditions: